| Atomic Force Microscope S.I.S-ULTRAObjective NANOStation II | |
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| An Atomic Force Microscope (AFM) provides 3 dimensional topographic information about a sample by probing its surface structure with a very sharp tip. The tip is scanned laterally across the surface, and the vertical movements of the tip are recorded and used to construct a quantitative 3 dimensional topographic map. The lateral resolution of the image can be as small as the tip radius (typically 5-15 nm), and the vertical resolution can be on the order of angstroms. | |
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Technique Advantages: Quantitative topographical information at high lateral resolution; Little or no sample prep in many cases; Non-destructive; Applicable to conductive and insulating materials. Specifications: Range: 51 µm x 51 µm, Resolution: about 7 nm Microscope: Zeiss Axiotech H/HD/HD-DIC on granite stand Stages: motorized vertical stage numerous types available: manual, motorized... Dimensions of sample: height: 0.1-4 mm, width: 50 mm, length: 50 mm. Workbench: rigid workbench including high performance antivibration table top MOD-1 |
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