Laborator Caracterizare Electrică și Fotoelectrică | National Center for Materials Study and Testing

Keithley 2400 General Purpose Source Meter w/Measurements
The 2400 from Keithley is a 200V, 1A, 20W SourceMeter® unit (SMU) instrument designed specifically for test applications that demand tightly coupled sourcing and measurement. It provides precision voltage and current sourcing as well as measurement capabilities. The SourceMeter SMU instrument is both a highly stable DC power source and a true instrument-grade 6½-digit multimeter. The power source characteristics include low noise, precision, and readback. The multimeter capabilities include high repeatability and low noise. The result is a compact, single-channel, DC parametric tester. In operation, this instrument can act as a voltage source, a current source, a voltage meter, a current meter, and an ohmmeter.
Key Features • Power of five instruments in one (IV source, IVR measure), source and sink (4-quadrant) operation • 0.012% basic measure accuracy with 6½-digit resolution • 2-, 4-, and 6-wire remote V-source and measure sensing • 1700 readings/second at 4.5 digits via GPIB • Source and sink (four-quadrant) operation • Pass/fail comparator for fast sorting/binning • Programmable DIO port for automation/handler/prober control • Standard SCPI GPIB, RS-232 and Keithley Trigger Link interfaces • Perform I-V characterization using Keithley's KickStart software

Keithley 2400 General Purpose Source Meter w/Measurements

The 2400 from Keithley is a 200V, 1A, 20W SourceMeter® unit (SMU) instrument designed specifically for test applications that demand tightly coupled sourcing and measurement. It provides precision voltage and current sourcing as well as measurement capabilities. The SourceMeter SMU instrument is both a highly stable DC power source and a true instrument-grade 6½-digit multimeter. The power source characteristics include low noise, precision, and readback. The multimeter capabilities include high repeatability and low noise. The result is a compact, single-channel, DC parametric tester. In operation, this instrument can act as a voltage source, a current source, a voltage meter, a current meter, and an ohmmeter.

Key Features
•   Power of five instruments in one (IV source, IVR measure), source and sink (4-quadrant) operation
•   0.012% basic measure accuracy with 6½-digit resolution
•   2-, 4-, and 6-wire remote V-source and measure sensing
•   1700 readings/second at 4.5 digits via GPIB
•   Source and sink (four-quadrant) operation
•   Pass/fail comparator for fast sorting/binning
•   Programmable DIO port for automation/handler/prober control
•   Standard SCPI GPIB, RS-232 and Keithley Trigger Link interfaces
•   Perform I-V characterization using Keithley's KickStart software

Keithley 6430- Sub-Femtoap Remote SourceMeter
The Model 6430 Sub-Femtoamp Remote SourceMeter SMU Instrument combines the voltage and current sourcing and measurement functions of Keithley's popular SourceMeter SMU instruments with sensitivity, noise, and input resistance specifications superior to electrometers. This unique combination of broad functionality and exceptional measurement integrity is made possible by the Model 6430's Remote PreAmp, which offers a very sensitive bi-directional amplifier with sensitive feedback elements for measuring or sourcing currents at the device being tested. The high level signals output by the Remote PreAmp are sent to the controlling mainframe via a two-meter cable. This allows the user to make a direct or very short connection to the signal, minimizing the effects of cable noise.
Key Features • 0.4fA p-p (4E - 16A) noise (typical) • Remote PreAmp can be located at the signal source to minimize cable noise • >1016Ω input resistance on voltage measurements • High speed - up to 2000 readings/second • Up to 6½-digit resolution • Fast characterization of components with programmable digital I/O and interfaces

Keithley 6430- Sub-Femtoap Remote SourceMeter

The Model 6430 Sub-Femtoamp Remote SourceMeter SMU Instrument combines the voltage and current sourcing and measurement functions of Keithley's popular SourceMeter SMU instruments with sensitivity, noise, and input resistance specifications superior to electrometers. This unique combination of broad functionality and exceptional measurement integrity is made possible by the Model 6430's Remote PreAmp, which offers a very sensitive bi-directional amplifier with sensitive feedback elements for measuring or sourcing currents at the device being tested. The high level signals output by the Remote PreAmp are sent to the controlling mainframe via a two-meter cable. This allows the user to make a direct or very short connection to the signal, minimizing the effects of cable noise.

Key Features
•   0.4fA p-p (4E - 16A) noise (typical)
•   Remote PreAmp can be located at the signal source to minimize cable noise
•   >1016Ω input resistance on voltage measurements
•   High speed - up to 2000 readings/second
•   Up to 6½-digit resolution
•   Fast characterization of components with programmable digital I/O and interfaces

Keithley 590 / 1M / E 1MHz C-V Analyze
The Keithley 590 C-V Analyzer measures capacitance versus voltage (C-V) and capacitance versus time (C-t) characteristics of semiconductor devices. Unlike other capacitance measurement instruments, the 590 has been tailored to the requirements of semiconductor device testing. High frequency (100 kHz or 1 MHz) C-V measurements are commonly applied to test p-n or schottky junction and tal-Insulator-Semiconductor (MIS) devices for device characterization and process control. C-V results are highly correlated with performance parameters of functional devices such as FETs, memory cells, CCDs, and isolation structures.

Keithley 590 / 1M / E 1MHz C-V Analyze

The Keithley 590 C-V Analyzer measures capacitance versus voltage (C-V) and capacitance versus time (C-t) characteristics of semiconductor devices. Unlike other capacitance measurement instruments, the 590 has been tailored to the requirements of semiconductor device testing.

High frequency (100 kHz or 1 MHz) C-V measurements are commonly applied to test p-n or schottky junction and tal-Insulator-Semiconductor (MIS) devices for device characterization and process control. C-V results are highly correlated with performance parameters of functional devices such as FETs, memory cells, CCDs, and isolation structures.

ARS Closed Cycle Cryostat, model CS202AE-01 with Temperature Controller Model SI 9700-1
The CS202-AE-01 cryostat is powered by a DE-202 closed cycle cryocooler. This liquid helium-free cryostat uses a pneumatically driven Gifford-McMahon cycle to cool the sample. It is an excellent choice for most sample and device testing. This system is well suited for optical, electrical, and magnetic sample testing.
Configuration: • Cold head (DE-202AE) • Compressor (ARS-4HW) • 2 helium hoses • Aluminum vacuum shroud with 4 window ports for optical and electrical experiments (DMX-1AL) • Aluminum radiation shield 1 high purity quartz windows Instrumentation for temperature measurement and control: • 10 pin hermetic feed through • 36 ohm thermofoil heater • Silicon diode sensor curve matched to (± 0.5 K) for control • Calibrated silicon diode sensor (±12 mK) with 4 in. free length for accurate sample measurement Wiring for electrical experiments: • 10 pin feedthrough • 4 copper wires • Sample holder for optical and electrical experiments • Temperature controller Applications: • Optical • Electro-optical • Electro & photoluminescence • Resistivity/Hall probe experiments • Magneto-optical • Thermal, electrical and magnetic susceptibility

ARS Closed Cycle Cryostat, model CS202AE-01 with Temperature Controller Model SI 9700-1

The CS202-AE-01 cryostat is powered by a DE-202 closed cycle cryocooler. This liquid helium-free cryostat uses a pneumatically driven Gifford-McMahon cycle to cool the sample. It is an excellent choice for most sample and device testing. This system is well suited for optical, electrical, and magnetic sample testing.

Configuration:

•   Cold head (DE-202AE)
•   Compressor (ARS-4HW)
•   2 helium hoses
•   Aluminum vacuum shroud with 4 window ports for optical and electrical experiments (DMX-1AL)
•   Aluminum radiation shield 1 high purity quartz windows

Instrumentation for temperature measurement and control:

•   10 pin hermetic feed through
•   36 ohm thermofoil heater
•   Silicon diode sensor curve matched to (± 0.5 K) for control
•   Calibrated silicon diode sensor (±12 mK) with 4 in. free length for accurate sample measurement

Wiring for electrical experiments:

•   10 pin feedthrough
•   4 copper wires
•   Sample holder for optical and electrical experiments
•   Temperature controller

Applications:

•   Optical
•   Electro-optical
•   Electro & photoluminescence
•   Resistivity/Hall probe experiments
•   Magneto-optical
•   Thermal, electrical and magnetic susceptibility

Nd:YAG Laser LP-603
Specifications: Tuning range, nm Signal 410…710 Idler 710…2500 Second harmonic  210…420 Output pulse energy, mJ 2 Signal 90 Idler 35 Second harmonic  15 • Divergence, mrad  < 2 • Linewidth, cm -1  4…6 • Pump wavelength, nm 355 • Max pump pulse energy, mJ 350 • Pulse width, ns 4... 12 • Beam quality MM, without “hot” spot • Divergence, mrad < 1.5

Nd:YAG Laser LP-603

Specifications:

Tuning range, nm
Signal 410…710
Idler 710…2500
Second harmonic  210…420

Output pulse energy, mJ 2
Signal 90
Idler 35
Second harmonic  15

•   Divergence, mrad  < 2
•   Linewidth, cm -1  4…6
•   Pump wavelength, nm 355
•   Max pump pulse energy, mJ 350
•   Pulse width, ns 4... 12
•   Beam quality MM, without “hot” spot
•   Divergence, mrad < 1.5

Monochromator MDR-2
Spectroscopic analysis of reflection and transmission spectra in diapason 200 nm - 2500 nm. Resolution 7A/mm.